Research

X-Ray Devices and Systems

Scientific discoveries and innovations rely on the constantly emerging techniques of observation and instrumentation. The advantages of extreme ultraviolet, X-ray, and neuron include shorter wavelengths and higher photon or particle energy, attributing them with a higher resolution, “core” level detection of electron state, and larger penetration depth when applied as a technique of observation. Therefore, they have been widely used in microscopy and telescope applications, as well as for the fabrication of ultra-high precisions under extreme conditions.

Research Directions

Team

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  • Liuyang Pan

    2016 PhD Candidate

  • Qiaoyu Wu

    2018 PhD Candidate

  • Qiya Zhang

    2018 PhD Candidate

  • Jialian He

    2018 PhD Candidate

  • Yifan Zhu

    2020 PhD Candidate

Publications

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  • Ultrafast time-resolved pump-probe investigation of nanosecond extreme ultraviolet light induced damage dynamics on B4C/Ru nano-bilayer film

    Liuyang Pan, Shuhui Li, Jinyu Cao, Jiali Wu, Zhe Zhang, Kun Wang, Qiushi Huang, Bin Ma, Wenbin Li*, and Zhanshan Wang*

    DOI:10.1021/acs.nanolett.2c01171

    Related Articles
    https://doi.org/10.1021/acs.nanolett.2c01171

  • High-resolution X-ray flash radiography of Ti characteristic lines with multilayer Kirkpatrick–Baez microscope at the Shenguang-II Update laser facility

    Shengzhen Yi, Feng Zhang, Qiushi Huang, Lai Wei, Yuqiu Gu, and Zhanshan Wang, High Power Laser Science and Engineering, 9, e42 (2021)

    DOI:10.1017/hpl.2021.30

    Related Articles
    https://doi.org/10.1017/hpl.2021.30

  • Evolution of chemical, structural, and mechanical properties of titanium nitride thin films deposited under different nitrogen partial pressure

    Runze Qi, Liuyang Pan, Yufei Feng, Jiali Wu, Wenbin Li, Zhanshan Wang, Results in Physics, 19, 103416 (2020).

    DOI:10.1016/j.rinp.2020.103416

    Related Articles
    https://doi.org/10.1016/j.rinp.2020.103416

  • Realization of wafer-scale nanogratings with sub-50 nm period through vacancy epitaxy

    Qiushi Huang, Qi jia, Jiangtao Feng, Hao Huang, Xiaowei Yang, Joerg Grenzer, Kai Huang, Shibing Zhang, Jiajie Lin, Hongyan Zhou, Tiangui You, Wenjie Yu, Stefan Facsko, Philippe Jonnard, Meiyi Wu, Angelo Giglia, Zhong Zhang, Zhi Liu, Zhanshan Wang, Xi Wang

    DOI:10.1038/s41467-019-10095-2

    Related Articles
    https://doi.org/10.1038/s41467-019-10095-2

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