Model: Dimension Icon

Introduction: This microscope can measure and gather information about the tiny surface features of samples, including their roughness. It is able to detect a variety of materials and achieve precise measurements on ultra-smooth substrates and low-roughness optical films. Additionally, it can identify sub-Ermian longitudinal information and has a maximum scanning range of 100 um x 100 um. Scope of Use: (1) Can be used for different types of materials such as conductors, semiconductors and insulators. (2) Able to test the surface of both flat and curved samples with small curvatures. (3) Can analyse surface information, such as roughness and PSD.