Model: ContourGT-X3.

Introduction: The device uses lenses with magnifications of 2.5X, 10X and 50X. It has a scanning range of 0.1nm to 10mm along the z-axis. It also has an integrated working platform that resists vibration and an 8-inch platform for measuring sample surfaces. Surface analysis is used to measure and analyse the various characteristics of a surface, such as flatness, roughness, corrugation, co-planarity, profile, defects, wear, pore clearance, and step height. This analysis is suitable for examining materials like polymers, metals, ceramics, as well as optics, including optical substrates and thin films. It provides accurate measurement of roughness and characterisation of surface microstructure.