Being a precision measurement technology on the nanometric scale, nanometrology is a fundamental technology adopted by advanced nano-fabrication. The development of nanometrological standard substances is vital, not only to guarantee the dissemination of traceability, an elementary topic in nanometrology, but also to ensure the unity and accuracy of nano-geometric measurements. Thus far, nanotechnology is evolving towards the direction of reducing characteristic dimensions, which has forced the advanced manufacturing industry to urgently find nano-length standard substances with high accuracy and stability, including the linewidth, step height, linear scale, pitch (one-dimensional grating, 1D), and grid (two-dimensional grating, 2D).
The division has been committed to the study of physicochemical properties and quantity-value dissemination of natural constants, including grating standard reference materials and nano-displacement measurement.
The division is committed to the research of nanostructure measurements and metrological instruments, including soft X-ray interference lithography (XIL), multilayer linewidth technology, and metrological instrument developments, etc.
2023 Postgraduate
2019 PhD Candidate
2020 PhD candidate
2021 PhD candidate
2022 PhD candidate