Research

Optical Nanometrology and Measurement

Being a precision measurement technology on the nanometric scale, nanometrology is a fundamental technology adopted by advanced nano-fabrication. The development of nanometrological standard substances is vital, not only to guarantee the dissemination of traceability, an elementary topic in nanometrology, but also to ensure the unity and accuracy of nano-geometric measurements. Thus far, nanotechnology is evolving towards the direction of reducing characteristic dimensions, which has forced the advanced manufacturing industry to urgently find nano-length standard substances with high accuracy and stability, including the linewidth, step height, linear scale, pitch (one-dimensional grating, 1D), and grid (two-dimensional grating, 2D).

Team

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  • Li Yao

    2023 Postgraduate

  • Zhaohui Tang

    2019 PhD Candidate

  • Zichao Lin

    2020 PhD candidate

  • Xie Zhangning

    2021 PhD candidate

  • Guangxu Xiao

    2022 PhD candidate

Publications

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  • Scanning and Splicing Atom Lithography for Self-traceable Nanograting Fabrication

    Deng Xiao, Tan Wen, Tang Zhaohui, et al, Nanomanuf Metrol 5, 179–187(2022)

    DOI:10.1007/s41871-022-00140-y

    Related Articles
    https://doi.org/10.1007/s41871-022-00140-y

  • Critical dimension scanning electron microscope characterization of smoothly varying wave structures with MC simulation

    Muhammad Saadat Shakoor Khan, Yang Lihao, Deng Xiao, et al, Journal of Physics D: Applied Physics, 2021, 54(44):445301 (14pp).

    DOI:10.1088/1361-6463/ac0de5

    Related Articles
    https://iopscience.iop.org/article/10.1088/1361-6463/ac0de5

  • A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope

    Deng Xiao, Dai Gaoliang, Liu Jie, et al, Ultramicroscopy, 2021,226.

    DOI: 10.1016/j.ultramic.2021.113293

    Related Articles
    https://doi.org/10.1016/j.ultramic.2021.113293

  • Hybrid application of laser-focused atomic deposition and extreme ultraviolet interference lithography methods for manufacturing of self-traceable nanogratings

    Liu Jie, Zhao Jun, Deng Xiao, et al, Nanotechnology, 2021, 32(17):175301-.

    DOI:10.1088/1361-6528/abdcec

    Related Articles
    https://iopscience.iop.org/article/10.1088/1361-6528/abdcec

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