Mainly engaged in the research of nanometer length metrology.

……

paper:

[1] Li Tongbao*, From Blackbody Radiation Standard to Quantum Candela, Light Sources and Illumination, 2016, 4:1-4.

[2] Deng Xiao, Li Tong-Bao*, Lei Li-Hua, Ma Yan, Ma Rui, Weng Jun-Jing, Li Yuan, Fabrication and measurement of traceable pitch standard with a big area at trans-scale, Chinese Physics B , 2014, 23(9): 090601(1-5).

[3] Deng Xiao, Ma Yan; Zhang Pingping, Zhang Wangjing, Chen Sheng, Xiao Shengwei, Li Tongbao*, Investigation of shadow effect in laser-focused atomic deposition, Applied Surface Science, 2012, 261: 464-469.

[4] Ma Yan*, Zhang Baowu, Zheng Chunlan, Ma Shanshan, Li Fusheng, Wang Zhanshan, Li Tongbao, Preliminary experimental research on Cr atom deposition nano-grating formed by laser standing wave field, Acta Physica Sinica, 2007,56:1365-1369.

[5] Li Tongbao*, Nanometer Metrology and Transfer Standards, Shanghai Metrology Test, 2005, 32:8-13.

patent:

[1] A method for preparing a two-dimensional atomic lithographic grid structure 201810548515.3

[2] A device for realizing step-deposition two-dimensional atomic lithography 201810548512.X

1. In 1989, won the first prize of National Science and Technology Progress Award

2. In 1985, won the first prize of National Science and Technology Progress Award