论著列表-同济大学精密光学工程技术研究所

代表性论著论著列表

21、Asymmetric line edge roughness of multilayer grating reference materials
Wang Xingrui, Cheng Xinbin, Zhang Longfei, et al. Aip Adv, 2018, 8(3)
22、Optimization of Nano-Grating Pitch Evaluation Method Based on Line Edge Roughness Analysis
Chen Jie, Liu Jie, Wang Xingrui, et al. Meas Sci Rev, 2017, 17(6): 264-268
23、从黑体辐射标准到量子坎德拉
李同保.光源与照明,2016(04):1-4
24、Fabrication and characterization of one-dimensional multilayer gratings for nanoscale microscope calibration
Wang Xingrui, Zhao Yang, Liu Jie, et al. Nanoengineering: Fabrication, Properties, Optics, and Devices Xiii, 2016, 9927
25、Characterization of one-dimensional gratings fabricated by laser-focused atomic deposition
Liu Jie, Cheng Xinbin, Chen Jie, et al. Nanoengineering: Fabrication, Properties, Optics, and Devices Xiii, 2016, 9927
26、Spatially resolved scanning tunneling spectroscopy of single-layer steps on Si(100) surfaces
Xiqiao Wang,Pradeep Namboodiri,Kai Li,Xiao Deng,Richard Silver. Phys Rev B, 2016, 94(12)
27、Silicon epitaxy on H-terminated Si (100) surfaces at 250℃
Xiao Deng, Pradeep Namboodiri, Kai Li, et al. Applied Surface Science,2016,378:301-307
28、Displacement Determination of the Guard Electrode for the New Calculable Capacitor at NIM
Wang Jianbo, Qian Jin, Liu ZhongYou, et al. Ieee T Instrum Meas, 2016, 65(11): 2569-77
29、计算电容中Fabry-Perot干涉仪测量位移的相位修正方法
王建波,钱进,刘忠有,陆祖良,黄璐,杨雁,殷聪,李同保.物理学报,2016,65(11):48-56
30、Characteristics of Local Anodic Oxidation of Silicon Surfaces by AFM and Fabrication of Nanoscale Metrology Standard Sample
Cheng Feng,Ma Yan,Ma Rui,Li Tongbao. Nanotechnology and Precision Engineering,2016,14(2):150-157

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