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A new method to calibrate an atomic force microscope with the self-traceable chromium grating fabricated by atomic lithography
Time:2020-12-04
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Gu Zhenjie, Deng Xiao, Cai Yanni, et al. Proc Spie, 2020, 11617.
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Study on diffraction efficiency of Cr nanograting prepared by laser-focused atomic deposition
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The effects of thermocompression bonding on Si/ SiO2 multilayer thin-film based critical dimension structures
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