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Origin and compensation of deposition errors in a broadband antireflection coating prepared using quartz crystal monitoring
Time:2018-05-02
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Dong S , Jiao H , Zhang J , et al. Thin solid films, 2018.
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Laser-induced damage of nodular defects in dielectric multilayer coatings
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Morphology and growth properties of nano- and submicrometer-scale initial damage sites under 355 nm wavelength pulsed laser irradiation
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