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Home / Research / Research Areas / X-ray Devices and Systems / Publications / Publication List / Content

High-resolution X-ray flash radiography of Ti characteristic lines with multilayer Kirkpatrick–Baez microscope at the Shenguang-II Update laser facility

Time：2021-05-26 Publisher： Source： Visit:

Shengzhen Yi, Feng Zhang, Qiushi Huang, Lai Wei, Yuqiu Gu, and Zhanshan Wang, High Power Laser Science and Engineering, 9, e42 (2021)

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