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Infrared Scanning Near-field Optical microscope

Infrared Scanning Near-field Optical Microscope

Model: nanoIR-3s

Brand：Bruker

Introduction：This system perfectly integrates scattering-type scanning near-field optical microscopy (s-SNOM), nanoscale infrared spectroscopy (AFM-IR) and atomic force microscopy (AFM) into a single platform, which can realize ～10 nm spatially resolved optical probing on the sample.

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Copyright: Institute of precision optical engineering technology, Tongji University

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