Research

Desktop Scatterometer - ALBATROSS-TT

Equipment Name: ALBATROSS-TT Desktop Scatterometer


Main Function: Primarily used for laser thin-film component scatter measurements, including small-angle scattering, bidirectional reflectance distribution function (BRDF), bidirectional transmittance distribution function (BTDF), and scattering loss. Additionally, it can measure reflectance and transmittance.


Technical Specifications:

- Angular Resolution: <0.001°

- Supports different incident and detection polarizations

- Supports two-dimensional and three-dimensional scanning systems

- Testing Wavelengths: 320nm, 633nm, 808nm, 1064nm


Applications:

(1) Suitable for measuring coatings or substrate samples on flat or curved surfaces.

(2) Maximum Sample Weight: 1kg

(3) Maximum Sample Size: 200mm x 100mm

(4) Capable of generating Angularly Resolved Scatter (ARS) data for samples under conditions of high angular resolution and high detection sensitivity.