Equipment Name: Optical Profilometer

Model: ContourGT-x3

Technical Specifications:

- Optical Lens Magnification: 2.5x, 10x, 50x

- Z-Axis Scanning Range: 0.1nm to 10mm

- Integrated anti-vibration working platform, with an 8-inch platform for seamless measurement of sample surfaces.

- Surface microstructure measurement, capable of measuring and analyzing surface features such as flatness, roughness, waviness, coplanarity, form deviation, surface defects, wear conditions, pore functionalities, step heights, and more.

Applications:

(1) Materials Field: Measurement of microsurface morphology on materials like polymers, metals, ceramics, etc.

(2) Optical Field: Characterization of the microsurface morphology of optical substrates and thin films, precise measurement of roughness, and more.