科学研究

High-resolution X-ray flash radiography of Ti characteristic lines with multilayer Kirkpatrick–Baez microscope at the Shenguang-II Update laser facility
Shengzhen Yi, Feng Zhang, Qiushi Huang, Lai Wei, Yuqiu Gu, and Zhanshan Wang, High Power Laser Science and Engineering, 9, e42 (2021)

发布时间：2021-05-26 发布者：来源：浏览：

Shengzhen Yi, Feng Zhang, Qiushi Huang, Lai Wei, Yuqiu Gu, and Zhanshan Wang, High Power Laser Science and Engineering, 9, e42 (2021)

Shengzhen Yi, Feng Zhang, Qiushi Huang, Lai Wei, Yuqiu Gu, and Zhanshan Wang, High Power Laser Science and Engineering, 9, e42 (2021)