Internal database
Contact us
中文
Home
Overview
Introduction
Cultural Beliefs
Organization
Current Administrators
Successive Administrators
Research Team
Research Team
Professors / Researchers
Associate Professors / Associate Researchers
Assistant Professors
Postdoctoral Researchers
Administrative / Technical Staffs
Visiting Scholars
Research
Research Areas
Research Platform
Industry-University-Research Collaboration
Publications
International Cooperation
Education
Graduates
Undergraduates
Alumni
Academic Highlights
Life Silhouettes
Student Recruitment
Recruitment Information
Researchers
Internal database
Contact us
中文
Home
Overview
Introduction
Cultural Beliefs
Organization
Current Administrators
Successive Administrators
Research Team
Research Team
Professors / Researchers
Associate Professors / Associate Researchers
Assistant Professors
Postdoctoral Researchers
Administrative / Technical Staffs
Visiting Scholars
Research
Research Areas
Research Platform
Industry-University-Research Collaboration
Publications
International Cooperation
Education
Graduates
Undergraduates
Alumni
Academic Highlights
Life Silhouettes
Student Recruitment
Recruitment Information
Researchers
Research
Home
/
Research
/
Research Areas
/
Optical Nanometrology and Measurement
/
Students
/
Students
/
Content
Research
News
Research Directions
Ultra-precision Length Standard reference materials and Applications
Measurement and Metrological Instrumentation of Nanostructures
Teachers
Students
Students
Alumni
Publications
Selected Publications
Publication List
Research Infrastructure
Chang Zhikun
Prev:
Yin Zhijun
Next:
Gou Jinming
Return to the list