- 1、HfO2/SiO2 nanolaminate-based composites prepared by ion beam sputtering for low-loss optics
Xinshang Niu, Hongfei Jiao, Bin Ma, Jinlong Zhang, Xinbin Cheng, Zhangshan Wang, Opt. Eng. 2021, 61(3)
- 2、Critical dimension scanning electron microscope characterization of smoothly varying wave structures with MC simulation
Khan M S S , Yang L H, Deng X, et al, Journal of Physics D: Applied Physics, 2021, 54(44):44530
- 3、High-resolution X-ray flash radiography of Ti characteristic lines with multilayer Kirkpatrick–Baez microscope at the Shenguang-II Update laser facility
Shengzhen Yi, Feng Zhang, Qiushi Huang, Lai Wei, Yuqiu Gu, and Zhanshan Wang, High Power Laser Science and Engineering, 9, e42 (2021
- 4、A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope
Xiao Deng, Gaoliang Dai, Jie Liu, et al, Ultramicroscopy, 2021,226
- 5、Hf1-xSixO2 Nanocomposite Coatings Prepared by Ion-Assisted Co-Evaporation Process for Low-Loss and High-LIDT Optics
Jiao H, Niu X, Zhang J, et al. Materials, 2021, 14(10)
- 6、Hybrid application of laser-focused atomic deposition and extreme ultraviolet interference lithography methods for manufacturing of self-traceable nanogratings
Liu Jie, Zhao Jun, Deng Xiao, et al, Nanotechnology, 2021, 32(17):175301-
- 7、Damage characteristics of dual-band high reflectors affected by nodule defects in the femtosecond regime
Ma B, Han J, Li J, et al. Chinese optics letters, 2021, 19(8)
- 8、Rectangular multilayer dielectric gratings with broadband high diffraction efficiency and enhanced laser damage resistance
Xie L , J Zhang, Zhang Z , et al. Optics Express, 2021, 29(2)