- 11、High-resolution X-ray flash radiography of Ti characteristic lines with multilayer Kirkpatrick–Baez microscope at the Shenguang-II Update laser facility
Shengzhen Yi, Feng Zhang, Qiushi Huang, Lai Wei, Yuqiu Gu, and Zhanshan Wang, High Power Laser Science and Engineering, 9, e42 (2021
- 12、A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope
Xiao Deng, Gaoliang Dai, Jie Liu, et al, Ultramicroscopy, 2021,226
- 13、Hf1-xSixO2 Nanocomposite Coatings Prepared by Ion-Assisted Co-Evaporation Process for Low-Loss and High-LIDT Optics
Jiao H, Niu X, Zhang J, et al. Materials, 2021, 14(10)
- 14、Hybrid application of laser-focused atomic deposition and extreme ultraviolet interference lithography methods for manufacturing of self-traceable nanogratings
Liu Jie, Zhao Jun, Deng Xiao, et al, Nanotechnology, 2021, 32(17):175301-
- 15、Damage characteristics of dual-band high reflectors affected by nodule defects in the femtosecond regime
Ma B, Han J, Li J, et al. Chinese optics letters, 2021, 19(8)
- 16、Rectangular multilayer dielectric gratings with broadband high diffraction efficiency and enhanced laser damage resistance
Xie L , J Zhang, Zhang Z , et al. Optics Express, 2021, 29(2)
- 17、Evolution of chemical, structural, and mechanical properties of titanium nitride thin films deposited under different nitrogen partial pressure
Runze Qi, Liuyang Pan, Yufei Feng, Jiali Wu, Wenbin Li, Zhanshan Wang, Results in Physics, 19, 103416 (2020)
- 18、Self-traceable nano-grating frequency doubling based on polarization gradient light field
Wang Xinpan, Deng Xiao, Cai Yanni, et al. Proc Spie, 2020, 11617
- 19、Optimization of line edge roughness before and after etching with photoresist in soft x-ray interference lithography
Tang Zhaohui, Deng Xiao, Cai Yanni, et al. Proc Spie, 2020, 11617
- 20、Study on diffraction efficiency of Cr nanograting prepared by laser-focused atomic deposition
Liu Jie, Deng Xiao, Cai Yanni, et al. Proc Spie, 2020, 11617