- 1、Evolution of chemical, structural, and mechanical properties of titanium nitride thin films deposited under different nitrogen partial pressure
Runze Qi, Liuyang Pan, Yufei Feng, Jiali Wu, Wenbin Li, Zhanshan Wang, Results in Physics, 19, 103416 (2020)
- 2、Nanocavity Clock Spectroscopy: Resolving Competing Exciton Dynamics in WSe2/MoSe2 Heterobilayers
May, M. A.#, Jiang, T.#, Du, C., Park, K.-D., Xu, X., Belyanin, A.*, Raschke, M. B.*, Nanocavity clock spectroscopy: resolving competing exciton dynamics in WSe2/MoSe2 heterobilayers. Nano Letters 21, 522-528 (2020). (#Contributed equally).
- 3、Self-traceable nano-grating frequency doubling based on polarization gradient light field
Wang Xinpan, Deng Xiao, Cai Yanni, et al. Proc Spie, 2020, 11617
- 4、Optimization of line edge roughness before and after etching with photoresist in soft x-ray interference lithography
Tang Zhaohui, Deng Xiao, Cai Yanni, et al. Proc Spie, 2020, 11617
- 5、Study on diffraction efficiency of Cr nanograting prepared by laser-focused atomic deposition
Liu Jie, Deng Xiao, Cai Yanni, et al. Proc Spie, 2020, 11617
- 6、A new method to calibrate an atomic force microscope with the self-traceable chromium grating fabricated by atomic lithography
Gu Zhenjie, Deng Xiao, Cai Yanni, et al. Proc Spie, 2020, 11617
- 7、The effects of thermocompression bonding on Si/ SiO2 multilayer thin-film based critical dimension structures
Cai Yanni, Deng Xiao, Wang Xinpan, et al. Proc Spie, 2020, 11617
- 8、Multi-field simulation of thin film filter with CW laser oblique incidence
Cao S , Ji X , Jiao H , et al. International Conference on Optoelectronic and Microelectronic Technology and Application. 2020
- 9、Interference suppression of light backscattering through oblique deposition of high-reflectivity multilayers: a theoretical analysis
Zhang J , Fang S , Kozhevnikov I V , et al. Optics Express, 2020, 28(21)
- 10、Influence of the surface and subsurface contaminants on laser-induced damage threshold of anti-reflection sub-wavelength structures working at 1064 nm
Liu F , Jiao H , Ma B , et al. Optics & Laser Technology, 2020, 127