科学研究

Research
  • LIDT of HfO2 SiO2 HR films by different test modes at 1064nm and 532nm

    ​Ma B , Tao D , Jiao H , et al. Proceedings of Spie the International Society for Optical Engineering, 2010, 7842.

    DOI:10.1117/12.867226

    Related Articles:https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7842/1/LIDT-of-HfO2-SiO2-HR-films-by-different-test-modes/10.1117/12.867226.full

  • Study of laser induced damage of high reflector at 1064 nm

    ​Jiao H , Cheng X , Shen Z , et al. Proceedings of SPIE - The International Society for Optical Engineering, 2010, 7842.

    DOI:10.1117/12.867241

    Related Articles:https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7842/1/Study-of-laser-induced-damage-of-high-reflector-at-1064/10.1117/12.867241.full

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