Zhang Longfei,Wang Xingrui,Deng Xiao,et al. ACTA METROLOGICA SINICA,2018,39(03):299-303.
DOI：10.3969/j.issn.1000-1158.2018.03.03
Related Articles：https://d.wanfangdata.com.cn/periodical/ChlQZXJpb2RpY2FsQ0hJTmV3UzIwMjIwNDE1Eg9qbHhiOTgyMDE4MDMwMDMaCGJ0NXdnNjMz
Wang Xingrui, Cheng Xinbin, Zhang Longfei, et al. Aip Adv, 2018, 8(3).
DOI：10.1063/1.5009513
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Chen Jie, Liu Jie, Wang Xingrui, et al. Meas Sci Rev, 2017, 17(6): 264-268.
DOI：10.1515/msr-2017-0032
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Wang Xingrui, Zhao Yang, Liu Jie, et al. Nanoengineering: Fabrication, Properties, Optics, and Devices Xiii, 2016, 9927.
DOI：10.1117/12.2236866
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Liu Jie, Cheng Xinbin, Chen Jie, et al. Nanoengineering: Fabrication, Properties, Optics, and Devices Xiii, 2016, 9927.
DOI：10.1117/12.2235906
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