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基于高精度复位技术的损伤阈值测量方法及测量装置
Time:2015-01-14
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专利类型:发明授权
申请/专利号: CN201210326252.4
发明/设计人:马彬; 张艳云; 马宏平; 程鑫彬; 焦宏飞; 王占山
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一种光学基板亚表面中纳米吸收中心深度分布的检测方法
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