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一种面向激光薄膜内部缺陷的溯源性损伤阈值测量方法
Time:2017-01-25
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专利类型:发明公开
申请/专利号: CN201410050368.9
发明/设计人:王占山;马彬 程鑫彬 马宏平 陆梦蕾 焦宏飞
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一种基于人工缺陷的激光薄膜定量化研究方法
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一种基于多次迭代刻蚀的透射光学元件损伤阈值提升方法
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